Collaborative Sensor Testing for Future Vertex Detectors at CERN

Monolithic Active Pixel Sensors (MAPS) represent cutting-edge technology in high-resolution, low-material budget detectors, pivotal for particle physics applications.

Our group is preparing to leverage this technology for vertex detection in a future FCC experiment. In parallel, our colleagues at MIT, led by Gian Michele Innocenti, are advancing the application of bent and staved MAPS sensors in 65 nm CMOS imaging technology for the upcoming Silicon Vertex Detector (SVT) in the ePIC experiment at the Electron-Ion Collider. You can explore more about their work here: MIT Pixel Lab. Gian Michele, along with Ivan Amos Cali, Leyre Florers, and their team, is establishing a lab at CERN to test these sensors.

On Monday, I visited Building 186 to see their newly acquired machine for testing these impressive, ultra-thin 12-inch sensors. Below a picture I captured of the probe station in action.

The next step is to develop a suite of automated tests to characterize these advanced devices. With the expertise of the ePIC-MIT group and the enthusiasm of the MIT students joining us at CERN during summer, I look forward to dive into this project laying groundwork towards FCC.

MIT wafer station at CERN

Leave a Reply

Your email address will not be published. Required fields are marked *